Secondary sampling: mixed
|Within Vocab||Argo vertical sampling schemes|
|Preferred Label||Secondary sampling: mixed|
|Definition||Secondary sampling scheme for which the 'mixed' sampling method was used. The secondary sampling profile has N_PROF>1, and is composed of measurements that are taken at pressure levels different from the primary sampling profile, or obtained by a sampling method different from that of the primary sampling profile. The 'mixed' sampling method refers to profiles composed of data points obtained by both the 'averaged' and 'discrete' sampling methods. Measurements can be taken by the Primary CTD or by auxiliary sensors.|
|Has Current Version||http://vocab.nerc.ac.uk/collection/R16/current/SECMIX/1/|
|Authored On||2020-05-03 20:29:08|
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