Secondary sampling: discrete
|Within Vocab||Argo vertical sampling schemes|
|Preferred Label||Secondary sampling: discrete|
|Definition||Secondary sampling scheme for which the 'discrete' sampling method was used. The secondary sampling profile has N_PROF>1, and is composed of measurements that are taken at pressure levels different from the primary sampling profile, or obtained by a sampling method different from that of the primary sampling profile. The 'discrete' sampling method refers to profiles where each data point was obtained from a single measurement (polling) from a sensor. Measurements can be taken by the Primary CTD or by auxiliary sensors.|
|Has Current Version||http://vocab.nerc.ac.uk/collection/R16/current/SECDIS/1/|
|Authored On||2020-05-03 20:29:08|
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