Concept
Secondary sampling: discrete
URI | http://vocab.nerc.ac.uk/collection/R16/current/SECDIS/ | |
---|---|---|
Within Vocab | Argo vertical sampling schemes | |
Alternative Labels | SECDIS | |
Definition | Secondary sampling scheme for which the 'discrete' sampling method was used. The secondary sampling profile has N_PROF>1, and is composed of measurements that are taken at pressure levels different from the primary sampling profile, or obtained by a sampling method different from that of the primary sampling profile. The 'discrete' sampling method refers to profiles where each data point was obtained from a single measurement (polling) from a sensor. Measurements can be taken by the Primary CTD or by auxiliary sensors. | |
Date | 2020-05-03T20:29:08 | |
Identifier | SDN:R16::SECDIS | |
Note | accepted | |
Has Current Version | 1 | |
version | 1 |
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