Concept
Concentration of silicon {Si CAS 7440-21-3} per unit volume of the sediment pore water [dissolved plus reactive particulate <0.2um phase] by in-situ pore water sampling, filtration, acidification and inductively-coupled plasma atomic emission spectroscopy
URI | http://vocab.nerc.ac.uk/collection/P01/current/LP02NAN4/ | ||
---|---|---|---|
Within Vocab | BODC Parameter Usage Vocabulary | ||
Alternative Labels | Si<0.2um_sed_pw_ICP | ||
Definition | The concentration of the specified analyte in sediment pore water passed through a 0.2um filter. The analytical method of inductively-coupled plasma atomic emission spectroscopy is also sometimes referred to as inductively-coupled plasma optical emission spectroscopy (ICP-OES). | ||
Date | 2025-07-01T08:36:01 | ||
Identifier | SDN:P01::LP02NAN4 | ||
Note | accepted | ||
Has Current Version | 1 | ||
version | 1 | ||
Broader | S06:S0600045 |
Concentration | Mapping: 2093386 |
P02:MTPW |
Metal concentrations in sediment pore waters | Mapping: 2093272 | |
S26:MAT00157 |
sediment pore water [dissolved plus reactive particulate <0.2um phase] | Mapping: 2093388 | |
S27:CS003151 |
silicon | Mapping: 2093390 | |
Related | S03:S03484 |
in-situ pore water sampling, filtration, acidification | Mapping: 2093382 |
S04:S04235 |
inductively-coupled plasma atomic emission spectroscopy | Mapping: 2093384 | |
P06:UGPL |
Micrograms per litre | Mapping: 2093274 | |
S02:S053 |
per unit volume of the | Mapping: 2093380 |
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