Concept
ZEISS {LEO} 1450 VP Scanning Electron Microscope (SEM)
| URI | http://vocab.nerc.ac.uk/collection/L22/current/TOOL1212/ | ||
|---|---|---|---|
| Within Vocab | SeaVoX Device Catalogue | ||
| Alternative Labels | ZEISS {LEO} 1450 VP | ||
| Definition | A scanning electron microscope (SEM) used for the imaging and analysis of specimens. The SEM comprises of two main parts, an electron column and electron detector. In the column an electron beam is generated which is rastered across the surface of the sample. Secondary electrons and backscattered electrons are emitted which are collected by the detector and form the specimen image in the microscope. The electron source is LaB6 or tungsten. The SEM can operate at variable pressure from 1 to 400 Pa and has a magnification range of 9 to 900,000 x. | ||
| Date | 2024-08-20T13:30:09 | ||
| Identifier | SDN:L22::TOOL1212 | ||
| Note | accepted | ||
| Has Current Version | 2 | ||
| Version | 1 | ||
| version | 2 | ||
| inScheme | http://vocab.nerc.ac.uk/scheme/SDNDEV/current/ | ||
| Broader | L05:LAB07 |
electron microscopes | Mapping: 1437640 |
| Related | B75:ORG01123 |
Carl Zeiss AG | Mapping: 1449104 |
L35:MAN0073 |
Carl Zeiss AG | Mapping: 1602171 | |
Alternate Formats
Other formats for this page:
RDF/XML Turtle JSON-LDAlternate Profiles
Other views of this page:
Alternate Profiles ?Different Media Types (HTML, text, RDF, JSON etc.) and different information model views, profiles, are available for this resource.
NVS html view ? Default NVS html view.
