@prefix cpm: . @prefix dc: . @prefix dcat: . @prefix dce: . @prefix dct: . @prefix dcterms: . @prefix grg: . @prefix iop: . @prefix ns0: . @prefix ns1: . @prefix owl: . @prefix pav: . @prefix prov: . @prefix puv: . @prefix qudt: . @prefix rdf: . @prefix rdfs: . @prefix reg: . @prefix semapv: . @prefix skos: . @prefix sssom: . @prefix void: . pav:hasCurrentVersion . rdf:type skos:Concept ; dce:identifier "SDN:L22::TOOL1568" ; dc:date "2020-11-16 10:27:56.0" ; dc:identifier "SDN:L22::TOOL1568" ; dc:isVersionOf ; pav:authoredOn "2020-11-16 10:27:56.0" ; pav:previousVersion ; pav:version "2" ; void:inDataset ; owl:deprecated "false" ; owl:versionInfo "2" ; skos:altLabel "Shimadzu SALD-7500nano" ; skos:broader ; skos:definition "A nano laser diffraction particle size analyser designed to measure particle size from nanometre to micrometre range. It also enables measurement of fine bubbles, and allows real-time tracing of the changes in the bubble diameter. The target particle size range is seamlessly covered using a single measurement principle, single optical system, and single light source. The application of the SLIT optical system, based on scattered light intensity tracing technology, continuously captures forward-scattered light at angles up to 60 degrees on a single detector face. It features a built-in self diagnostic function for system maintenance. It has a measurement range of 10 nm to 800 um for particles and 100 nm to 60 um for bubbles. It can operate between 10 and 30 degC and has a semiconductor laser at 405 nm wavelength. It has a 1 second measuring time."@en ; skos:notation "SDN:L22::TOOL1568" ; skos:note "accepted"@en ; skos:prefLabel "Shimadzu SALD-7500nano nano particle size analyzer"@en ; skos:related , .