@prefix cpm: . @prefix dc: . @prefix dcat: . @prefix dce: . @prefix dct: . @prefix dcterms: . @prefix grg: . @prefix iop: . @prefix ns0: . @prefix ns1: . @prefix owl: . @prefix pav: . @prefix prov: . @prefix puv: . @prefix qudt: . @prefix rdf: . @prefix rdfs: . @prefix reg: . @prefix sdo: . @prefix semapv: . @prefix skos: . @prefix sssom: . @prefix void: . @prefix xsd: . rdf:type sdo:DefinedTerm ; sdo:description "A vertical microstructure turbulence profiler for the measurement of dissipation-scale turbulence in oceans and lakes up to 500 m depth. It is equipped with microstructure velocity probes (shear probes), high-resolution temperature sensors (fast thermistors), pressure sensor and three-axis high accuracy accelerometers. The instrument includes a bottom landing guard and a deck unit for data communication. Optional extras include high-accuracy CTD sensors either a SBE7-38 microstructure conductivity sensor or SBE-3F/SBE-4C temperature and conductivity sensors. The VMP 500 is suitable for deployment from small vessels and can be powered by a 12 V car battery (using an inverter)."@en ; sdo:inDefinedTermSet ; sdo:name "Rockland Scientific Vertical Microstructure Profiler VMP 500"@en ; sdo:termCode "SDN:L22::TOOL0576" .