@prefix cpm: . @prefix dc: . @prefix dcat: . @prefix dce: . @prefix dct: . @prefix dcterms: . @prefix grg: . @prefix iop: . @prefix ns0: . @prefix ns1: . @prefix owl: . @prefix pav: . @prefix prov: . @prefix puv: . @prefix qudt: . @prefix rdf: . @prefix rdfs: . @prefix reg: . @prefix semapv: . @prefix skos: . @prefix sssom: . @prefix void: . skos:related . sssom:subject_id . skos:related . skos:related . sssom:object_id . rdf:type skos:Concept ; dce:identifier "SDN:L22::TOOL0364" ; dc:date "2011-01-28 12:46:19.0" ; dc:identifier "SDN:L22::TOOL0364" ; pav:authoredOn "2011-01-28 12:46:19.0" ; pav:hasCurrentVersion ; pav:version "1" ; void:inDataset ; owl:deprecated "false" ; owl:versionInfo "1" ; skos:altLabel "FSI ICTD" , "FSI ICTD"@en ; skos:broader , , , ; skos:definition "CTD profiler with a sampling frequency of 32Hz and a depth rating of 7000m. It is normally used in conjunction with a DT-2000 deck unit, although an internal memory can also be installed for self contained data logging. Parameters are measured to an accuracy of ±0.0002 S/m for conductivity, ±0.002°C for temperature and 0.01% for full scale pressure. The unit can support two additional primary temperature sensors and up to 8 auxiliary sensors."@en ; skos:inScheme ; skos:notation "SDN:L22::TOOL0364" ; skos:note "accepted"@en ; skos:prefLabel "Falmouth Scientific Instruments Integrated CTD Profiler"@en ; skos:related , , , . skos:narrower . sssom:object_id . sssom:object_id . skos:narrower . sssom:object_id . dc:isVersionOf . sssom:subject_id . skos:member . skos:related . skos:narrower . skos:narrower . skos:narrower . skos:related . skos:related . skos:related . skos:narrower . skos:narrower . sssom:subject_id . sssom:object_id . skos:narrower . sssom:object_id . sssom:subject_id . sssom:subject_id . sssom:object_id . sssom:subject_id . sssom:object_id . sssom:subject_id . skos:related . sssom:subject_id .