.
"SDN:S04::S04392" .
"" .
"accepted"@en .
"ion probe analysis"@en .
"2006-10-06 13:47:30.0" .
"false" .
"SDN:S04::S04392" .
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"1" .
"SDN:S04::S04392" .
"1" .
.
"A technique in which the specimen is bombarded by a focused beam of ions (diameter less than 10mm) causing ions to be ejected from the specimen. These are identified and quantified by passage through a mass spectrometer."@en .
"2006-10-06 13:47:30.0" .
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