. "SDN:S04::S04392" . "" . "accepted"@en . "ion probe analysis"@en . "2006-10-06 13:47:30.0" . "false" . "SDN:S04::S04392" . . "1" . "SDN:S04::S04392" . "1" . . "A technique in which the specimen is bombarded by a focused beam of ions (diameter less than 10mm) causing ions to be ejected from the specimen. These are identified and quantified by passage through a mass spectrometer."@en . "2006-10-06 13:47:30.0" . . . . . . . . . . . . .