. "An analytical technique used to identify crystalline solids by measuring the characteristic spaces between layers of atoms or molecules in a crystal."@en . "2006-10-02 18:26:59.0" . "false" . "" . "accepted"@en . . "1" . . "SDN:S04::S04110" . "SDN:S04::S04110" . "1" . . "X-ray diffraction"@en . "SDN:S04::S04110" . "2006-10-02 18:26:59.0" .