"An analytical technique used to identify crystalline solids by measuring the characteristic spaces between layers of atoms or molecules in a crystal."@en .
"SDN:S04::S04110" .
"" .
"SDN:S04::S04110" .
"2006-10-02 18:26:59.0" .
.
.
"2006-10-02 18:26:59.0" .
.
.
"X-ray diffraction"@en .
"SDN:S04::S04110" .
"accepted"@en .
"1" .
"1" .
"false" .