"An analytical technique used to identify crystalline solids by measuring the characteristic spaces between layers of atoms or molecules in a crystal."@en . "SDN:S04::S04110" . "" . "SDN:S04::S04110" . "2006-10-02 18:26:59.0" . . . "2006-10-02 18:26:59.0" . . . "X-ray diffraction"@en . "SDN:S04::S04110" . "accepted"@en . "1" . "1" . "false" .